Estimating Index of Refraction from Polarimetric Hyperspectral Imaging Measurements
Document Type
Article
Publication Date
8-8-2016
Abstract
Current material identification techniques rely on estimating reflectivity or emissivity which vary with viewing angle. As off-nadir remote sensing platforms become increasingly prevalent, techniques robust to changing viewing geometries are desired. A technique leveraging polarimetric hyperspectral imaging (P-HSI), to estimate complex index of refraction, N̂(ν̃), an inherent material property, is presented. The imaginary component of N̂(ν̃) is modeled using a small number of “knot” points and interpolation at in-between frequencies ν̃. The real component is derived via the Kramers-Kronig relationship. P-HSI measurements of blackbody radiation scattered off of a smooth quartz window show that N̂(ν̃) can be retrieved to within 0.08 RMS error between 875 cm−1 ≤ ν̃ ≤ 1250 cm−1. P-HSI emission measurements of a heated smooth Pyrex beaker also enable successful N̂(ν̃) estimates, which are also invariant to object temperature.
Source Publication
Optics Express
Recommended Citation
Jacob A. Martin and Kevin C. Gross, "Estimating index of refraction from polarimetric hyperspectral imaging measurements," Opt. Express 24, 17928-17940 (2016).
Comments
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