"Estimating index of refraction for material identification in comparis" by Jacob A. Martin and Kevin C. Gross 10.1117/12.2222971">
 

Estimating index of refraction for material identification in comparison to existing temperature emissivity separation algorithms

Document Type

Conference Proceeding

Publication Date

5-4-2016

Comments

Copyright © 2016 Society of Photo-Optical Instrumentation Engineers (SPIE).

This conference paper is available through subscription or purchase from the publisher, SPIE, using the DOI link below.

Author note: Kevin Gross was co-affiliated with the Air Force Research Laboratory at the time of this conference.

Source Publication

Polarization: Measurement, Analysis, and Remote Sensing XII

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