Contact resistance evolution of Au-Au micro-contacts with encapsulated Ag colloids

Authors

• Benjamin F. Toler, Air Force Institute of Technology
• Christopher Stilson, Air Force Institute of Technology
• Ronald A. Coutu Jr., Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

9-22-2013

Comments

Copyright © 2013, IEEE.

The full conference paper is available from IEEE via subscription or purchase, using the DOI link below.

Co-author C. Stilson was an AFIT graduate student (M.S.) at the time of this conference. (AFIT-ENG-14-M-73, March 2014 graduate)

DOI

10.1109/HOLM.2013.6651404

Source Publication

59th IEEE Holm Conference on Electrical Contacts, HOLM 2013

Recommended Citation

B. Toler, C. Stilson and R. Coutu, "Contact Resistance Evolution of Au-Au Micro-Contacts with Encapsulated Ag Colloids," 2013 IEEE 59th Holm Conference on Electrical Contacts (Holm 2013), Newport, RI, USA, 2013, pp. 1-8, doi: 10.1109/HOLM.2013.6651404.