Effects of a measurement floor on mueller matrix measurements in a DRR BSDF system

Authors

• Stephen E. Nauyoks, Air Force Institute of Technology
• Michael A. Marciniak, Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

10-15-2012

Comments

Copyright © 2012 Society of Photo-Optical Instrumentation Engineers (SPIE).

The full text of this conference paper is available from SPIE via subscription or purchase, using the DOI link on this page.

DOI

10.1117/12.929915

Source Publication

Proceedings of SPIE, Volume 8495: Reflection, Scattering, and Diffraction from Surfaces III

Recommended Citation

Stephen E. Nauyoks, Michael A. Marciniak "Effects of a measurement floor on Mueller matrix measurements in a DRR BSDF system", Proc. SPIE 8495, Reflection, Scattering, and Diffraction from Surfaces III, 84950W (15 Oct 2012); https://doi.org/10.1117/12.929915