Integrated Circuit (IC) Aging Effects on Radio-frequency Distinct Native Attributes (RF-DNA)

Authors

Randall D. Deppensmith, Air Force Institute of Technology
Samuel J. Stone, Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

6-2014

Comments

Copyright © 2014, IEEE.

This conference paper is available through subscription or purchase from the publisher, IEEE, using the DOI link below.

Author note: Randall Deppensmith was an AFIT PhD student at the time of this conference. AFIT-ENG-DS-16-D-002, December 2016)

DOI

10.1109/NAECON.2014.7045830

Source Publication

National Aerospace and Electronics Conference, Proceedings of the IEEE

Recommended Citation

R. D. Deppensmith and S. J. Stone, "Integrated circuit (IC) aging effects on radio-frequency distinct native attributes (RF-DNA)," NAECON 2014 - IEEE National Aerospace and Electronics Conference, Dayton, OH, USA, 2014, pp. 331-333, doi: 10.1109/NAECON.2014.7045830.