Micro-contact performance and reliability under low frequency, low amplitude, alternating current (AC) test conditions

Authors

Tod V. Laurvick, Air Force Institute of Technology
Ronald A. Coutu Jr., Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

10-11-2015

Comments

Copyright © 2015, IEEE.

This conference paper is available through subscription or purchase from the publisher, IEEE, using the DOI link below.

DOI

10.1109/HOLM.2015.7355101

Source Publication

2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)

Recommended Citation

T. V. Laurvick and R. A. Coutu, "Micro-contact performance and reliability under low frequency, low amplitude, alternating current (AC) test conditions," 2015 IEEE 61st Holm Conference on Electrical Contacts (Holm), San Diego, CA, USA, 2015, pp. 222-226, doi: 10.1109/HOLM.2015.7355101.