Experimental validation of external load effects on micro-contact performance and reliability

Authors

Tod V. Laurvick, Air Force Institute of Technology
Ronald A. Coutu Jr., Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

10-11-2015

Comments

Copyright © 2015, IEEE.

This conference paper is available through subscription or purchase from the publisher, IEEE, using the DOI link below.

DOI

10.1109/HOLM.2015.7355120

Source Publication

Electrical Contacts (Holm), 2015 IEEE 61st Holm Conference on

Recommended Citation

T. V. Laurvick and R. A. Coutu, "Experimental validation of external load effects on micro-contact performance and reliability," 2015 IEEE 61st Holm Conference on Electrical Contacts (Holm), San Diego, CA, USA, 2015, pp. 353-357, doi: 10.1109/HOLM.2015.7355120.