Device identification using active noise interrogation and RF-DNA "fingerprinting" for non-destructive amplifier acceptance testing

Authors

Mathew W. Lukacs, Air Force Institute of Technology
Peter J. Collins, Air Force Institute of Technology
Michael A. Temple, Air Force Institute of TechnologyFollow

Document Type

Conference Proceeding

Publication Date

4-11-2016

Comments

Copyright © 2016, IEEE.

This conference paper is available through subscription or purchase from the publisher, IEEE, using the DOI link below.

DOI

10.1109/WAMICON.2016.7483856

Source Publication

2016 IEEE 17th Annual Wireless and Microwave Technology Conference (WAMICON)

Recommended Citation

M. Lukacs, P. Collins and M. Temple, "Device identification using active noise interrogation and RF-DNA "fingerprinting" for non-destructive amplifier acceptance testing," 2016 IEEE 17th Annual Wireless and Microwave Technology Conference (WAMICON), Clearwater, FL, USA, 2016, pp. 1-6, doi: 10.1109/WAMICON.2016.7483856.