This collection on AFIT Scholar presents scholarly works of the faculty of the Air Force Institute of Technology
The Faculty Publications collection accepts scholarly works that are developed under the auspices of AFIT, and accepted for publication in a journal, or for presentation at a conference. All submissions should be approved for public release before submitting to AFIT Scholar
Secondary materials may be submitted along with an article or conference paper, for the purpose of experimental result repeatability.
To submit your work to AFIT Scholar, please click My Account, sign up if necessary, and once logged in, click submit research. For more information, please see the Policies for Faculty Publications, FAQ and Submission Guidelines.
Submissions from 2012
Auto-tuning Unit Norm Frames, Peter G. Casazza, Matthew C. Fickus, and Dustin G. Mixon
Optimal search for a random moving intruder, David W. Casbeer, Krishnamoorthy Kalyanam, Alexa Eggert, Phillip R. Chandler, and Meir Pachter
Photovoltaic device on a single ZnO nanowire p-n homojunction, Hak Cho, Anvar S. Zakirov, Shavkat U. Yuldashev, Chi Won Ahn, Tae Won Kang, and Yung-Kee Yeo
Analyzing military strategies via a stochastic wargame, James W. Chrissis, Jordan D. Lee, and Michael W. Garrambone
A Very Robust AlGaN/GaN HEMT Technology to High Forward Gate Bias and Current, Bradley D. Christiansen, Eric R. Heller, Ronald A. Coutu Jr., Ramakrishna Vetury, and Jeffrey B. Shealy
Flight Test Results for UAVs Using Boid Guidance Algorithms, Jason B. Clark and David R. Jacques
Practical Measurement of Complexity in Dynamic Systems, Jason B. Clark and David R. Jacques
Intrinsic Physical-Layer Authentication of Integrated Circuits, William E. Cobb, Eric D. Laspe, Rusty O. Baldwin, Michael A. Temple, and Yong C. Kim
Predictive mental workload modeling for semiautonomous system design: Implications for systems of systems, John M. Colombi, Michael E. Miller, Michael F. Schneider, Jason McGrogan, David S. Long, and John Plaga
The Local metallicity of gadolinium doped compound semiconductors, Juan A. Colon Santana, Pan Liu, Xianjie Wang, Jinke Tang, Stephen R. McHale, David J. Wooten, John W. McClory, James C. Petrosky, J. Wu, R. Palai, Ya B. Losovyj, and Peter A. Dowben
Using Modeling and Simulation to Examine the Benefits of a Network Tasking Order, Matthew D. Compton, Kenneth M. Hopkinson, Gilbert L. Peterson, and James T. Moore
The unreliable M/M/1 retrial queue in a random environment, James D. Cordeiro Jr. and Jeffrey P. Kharoufeh
Representations of probablistic situations, Jared Culbertson, Kirk Sturtz, and Mark E. Oxley
Automated aerial refueling position estimation using a scanning LiDAR, Joseph Curro, John F. Raquet, Thomas Pestak, Jared T. Kresge, and Mark A. Smearcheck
Cooperative layered sensing: a factor analysis on finding elusive mobile targets, Christopher K. Curtis and John M. Colombi
Flapping Wing Micro Air Vehicle Bench Test Setup, David H. Curtis, Mark F. Reeder, Craig E. Svanberg, Richard G. Cobb, and Gregory H. Parker
Characterizing Metal-Insulator-Transition (MIT) Phase Change Materials (PCM) for RF and DC Micro-switching Elements, Brent L. Danner and Ronald A. Coutu Jr.
Impact of trench and ramp film cooling designs to reduce heat release effects in a reacting flow, Michael R. DeLallo, Marc D. Polanka, and David L. Blunck
Exploratory Structural Investigation of a Hawkmoth-Inspired MAV’s Thorax, Luciano Demasi, Anthony N. Palazotto, Alex C. Hollenbeck, and Rauno Cavallaro
Two-Iris Method for the Electromagnetic Characterization of Conductor-Backed Absorbing Materials Using an Open-Ended Waveguide Probe, Gary D. Dester, Edward J. Rothwell, and Michael J. Havrilla
Determination of feature generation methods for PTZ camera object tracking, Daniel D. Doyle and Jonathan T. Black
An RF-DNA verification process for ZigBee networks, Clay K. Dubendorfer, Benjamin W.. Ramsey, and Michael A. Temple
Malware Target Recognition via Static Heuristics, Thomas E. Dube, Richard A. Raines, Gilbert L. Peterson, Kenneth W. Bauer, Michael R. Grimaila, and Steven K. Rogers
Hyperspectral Remote Sensing, Michael T. Eismann
Electromagnetic Interference (EMI) and Ionizing Radiation Effects on CMOS Devices, Nicholas A. Estep, James C. Petrosky, John W. McClory, Y. Kim, and Andrew J. Terzuoli Jr.