Document Type

Article

Publication Date

8-8-2016

Abstract

Current material identification techniques rely on estimating reflectivity or emissivity which vary with viewing angle. As off-nadir remote sensing platforms become increasingly prevalent, techniques robust to changing viewing geometries are desired. A technique leveraging polarimetric hyperspectral imaging (P-HSI), to estimate complex index of refraction, (ν̃), an inherent material property, is presented. The imaginary component of (ν̃) is modeled using a small number of “knot” points and interpolation at in-between frequencies ν̃. The real component is derived via the Kramers-Kronig relationship. P-HSI measurements of blackbody radiation scattered off of a smooth quartz window show that (ν̃) can be retrieved to within 0.08 RMS error between 875 cm−1 ≤ ν̃ ≤ 1250 cm−1. P-HSI emission measurements of a heated smooth Pyrex beaker also enable successful (ν̃) estimates, which are also invariant to object temperature.

Comments

Publisher version of record at OSA: https://doi.org/10.1364/OE.24.017928

Found as: Martin, J. A., & Gross, K. C. (2016). Estimating index of refraction from polarimetric hyperspectral imaging measurements. Optics Express, 24(16), 17928–17940. https://doi.org/10.1364/OE.24.017928

Posted on AFIT Scholar in accordance with Gold Open Access Policy Statement for Optics Express, found at: https://www.osapublishing.org/submit/review/open-access-policy-statement.cfm (12-month embargo).

DOI

10.1364/OE.24.017928

Source Publication

Optics Express

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