Avoiding Transients in Low-level Sensing of Secondary Electron Yield

Authors

Matthew Vincie, Air Force Institute of Technology
Tod Laurvick, Air Force Institute of Technology
Hengky Chandrahalim, Air Force Institute of TechnologyFollow
Richard G. Cobb, Air Force Institute of Technology
James M. Sattler, Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

10-2020

Abstract

Despite the discovery of secondary electron emission over a century ago, repeatability in secondary electron emission measurements remains challenging. This work discusses the transient effects associated with sensing low-level currents during SEY measurements. Operations in the low-level range are shown to be prone to long settling times, transmission line effects, and capacitive coupling between isolated circuits. By programming our measurement system to avoid transients, our system was able to perform SEY measurements with currents as low as 140 fA.

Comments

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DOI

10.1109/SENSORS47125.2020.9278865

Source Publication

IEEE Sensors 2020 Conference

Recommended Citation

M. Vincie, T. Laurvick, H. Chandrahalim, R. Cobb and J. Sattler, "Avoiding Transients in Low-level Sensing of Secondary Electron Yield," 2020 IEEE SENSORS, Rotterdam, Netherlands, 2020, pp. 1-4, doi: 10.1109/SENSORS47125.2020.9278865.