High-Temperature RF Material Characterization Using a Dual-Chambered Rectangular Waveguide Fixture

Authors

• Andrew E. Bogle, Air Force Institute of Technology
• Milo W. Hyde IV, Air Force Institute of Technology
• Michael J. Havrilla, Air Force Institute of Technology
• Jeffrey S. Sovern, Air Force Institute of Technology

Document Type

Article

Publication Date

9-2017

Comments

Copyright © 2017, IEEE

The full article is available via subscription or purchase, using the DOI link below.

DOI

10.1109/TIM.2017.2700918

Source Publication

IEEE Transactions on Instrumentation and Measurement

Recommended Citation

A. E. Bogle, M. W. Hyde, M. J. Havrilla and J. S. Sovern, "High-Temperature RF Material Characterization Using a Dual-Chambered Rectangular Waveguide Fixture," in IEEE Transactions on Instrumentation and Measurement, vol. 66, no. 9, pp. 2422-2427, Sept. 2017, doi: 10.1109/TIM.2017.2700918.