A novel and simple technique for measuring low-loss materials using the two flanged waveguides measurement geometry

Authors

• Milo W. Hyde IV, Air Force Institute of Technology
• Michael J. Havrilla, Air Force Institute of Technology
• Andrew E. Bogle, Air Force Institute of Technology

Document Type

Article

Publication Date

8-2011

Comments

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DOI

10.1088/0957-0233/22/8/085704

Source Publication

Measurement Science & Technology (ISSN 0957-0233)

Recommended Citation

Hyde IV, M. W., Havrilla, M. J., & Bogle, A. E. (2011). A novel and simple technique for measuring low-loss materials using the two flanged waveguides measurement geometry. Measurement Science & Technology, 22(8), 85704. https://doi.org/10.1088/0957-0233/22/8/085704