Characterization of Biaxial Anisotropic Material Using a Reduced Aperture Waveguide

Authors

• Benjamin R. Crowgey, Michigan State University
• Ozgur Tuncer, Michigan State University
• Junyan Tang, Michigan State University
• Edward J. Rothwell, Michigan State University
• Balasubramaniam Shanker, Michigan State University
• Leo C. Kempel, Michigan State University
• Michael J. Havrilla, Air Force Institute of Technology

Document Type

Article

Publication Date

10-2013

Comments

Copyright © 2013, IEEE

The full article is available from IEEE via subscription or purchase, using the DOI link below.

DOI

10.1109/TIM.2013.2259752

Source Publication

IEEE Transactions on Instrumentation and Measurement (ISSN 0018-9456)

Recommended Citation

B. R. Crowgey et al., "Characterization of Biaxial Anisotropic Material Using a Reduced Aperture Waveguide," in IEEE Transactions on Instrumentation and Measurement, vol. 62, no. 10, pp. 2739-2750, Oct. 2013, doi: 10.1109/TIM.2013.2259752.