Tunneling atomic force microscopy characterization of cuprous oxide thin films

Authors

• Brett Castle, Air Force Institute of Technology
• Alex G. Li, Air Force Institute of Technology
• Ronald A. Coutu Jr., Air Force Institute of Technology
• Robert L. Hengehold, Air Force Institute of Technology
• Joseph Van Nostrand, Air Force Research Laboratory

Document Type

Conference Proceeding

Publication Date

8-15-2011

Comments

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DOI

10.1109/NANO.2011.6144415

Source Publication

Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on

Recommended Citation

B. Castle, A. Li, R. Coutu, R. Hengehold and J. Van Nostrand, "Tunneling atomic force microscopy characterization of cuprous oxide thin films," 2011 11th IEEE International Conference on Nanotechnology, Portland, OR, USA, 2011, pp. 1470-1473, doi: 10.1109/NANO.2011.6144415.