An Improved Two-Layer Method for Nondestructively Characterizing Magnetic Sheet Materials Using a Single Rectangular Waveguide Probe

Authors

• Milo W. Hyde IV, Air Force Institute of Technology
• Michael J. Havrilla, Air Force Institute of Technology
• Andrew E. Bogle, Air Force Institute of Technology
• Edward J. Rothwell, Michigan State University
• Gary D. Dester, Michigan State University

Document Type

Article

Publication Date

10-2012

Comments

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DOI

10.1080/02726343.2012.716702

Source Publication

Electromagnetics

Recommended Citation

Hyde, M. W., Havrilla, M. J., Bogle, A. E., Rothwell, E. J., & Dester, G. D. (2012). An Improved Two-Layer Method for Nondestructively Characterizing Magnetic Sheet Materials Using a Single Rectangular Waveguide Probe. Electromagnetics, 32(7), 411–425. https://doi.org/10.1080/02726343.2012.716702