Sensitivity Analysis Method for Metasurface Scaling

Authors

• Kojo Otoo, Air Force Institute of Technology
• Noah T. Frandsen, Air Force Institute of Technology
• Michael A. Saville, Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

5-24-2026

Comments

© 2026 ACES

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Source Publication

2026 International Applied Computational Electromagnetics Society Symposium (ACES)

Recommended Citation

K. Otoo, N. T. Frandsen and M. A. Saville, "Sensitivity Analysis Method for Metasurface Scaling," 2026 International Applied Computational Electromagnetics Society Symposium (ACES), Thessaloniki, Greece, 2026, pp. 1-2.