Microswitch lifecycle test fixture for simultaneously measuring contact resistance (Rc) and contact force (Fc) in controlled ambient environments

Authors

• Thomas A. Edelmann, Air Force Institute of Technology
• Ronald A. Coutu Jr., Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

10-4-2010

Comments

Copyright © 2010, IEEE.

The full conference paper is available from IEEE via subscription or purchase, using the DOI link below.

DOI

10.1109/HOLM.2010.5619527

Source Publication

56th IEEE Holm Conference on Electrical Contacts, HOLM 2010

Recommended Citation

T. A. Edelmann and R. A. Coutu Jr., "Microswitch Lifecycle Test Fixture for Simultaneously Measuring Contact Resistance (Rc) and Contact Force (Fc) in Controlled Ambient Environment," 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts, Charleston, SC, USA, 2010, pp. 1-8, doi: 10.1109/HOLM.2010.5619527.