Electromagnetic material characterization of conductor- backed media using a NDE microstrip probe

Authors

• Michael J. Havrilla, Air Force Institute of Technology
• Andrew E. Bogle, University of Dayton Research Institute
• Milo W. Hyde IV, Air Force Institute of Technology
• Edward J. Rothwell, Michigan State University

Document Type

Conference Proceeding

Publication Date

9-12-2011

Comments

Copyright © 2011, IEEE.

The full conference paper is available from IEEE via subscription or purchase, using the DOI link below.

DOI

10.1109/ICEAA.2011.6046419

Source Publication

International Conference on Electromagnetics in Advanced Applications, 13th

Recommended Citation

M. J. Havrilla, A. E. Bogle, M. W. Hyde and E. J. Rothwell, "Electromagnetic material characterization of conductor- backed media using a NDE microstrip probe," 2011 International Conference on Electromagnetics in Advanced Applications, Turin, Italy, 2011, pp. 656-659, doi: 10.1109/ICEAA.2011.6046419.