An Extrapolation Method for Improving Waveguide Probe Material Characterization Accuracy

Authors

• Gary D. Dester, Michigan State University
• Edward J. Rothwell, Michigan State University
• Michael J. Havrilla, Air Force Institute of TechnologyFollow

Document Type

Article

Publication Date

5-2010

Comments

Copyright © 2010, IEEE
The full text of this article is available from IEEE via subscription or purchase, using the DOI link below.

DOI

10.1109/LMWC.2010.2045600

Source Publication

IEEE Microwave and Wireless Components Letters (ISSN 1531-1309)

Recommended Citation

G. D. Dester, E. J. Rothwell and M. J. Havrilla, "An Extrapolation Method for Improving Waveguide Probe Material Characterization Accuracy," in IEEE Microwave and Wireless Components Letters, vol. 20, no. 5, pp. 298-300, May 2010, doi: 10.1109/LMWC.2010.2045600.