Intrinsic Physical-Layer Authentication of Integrated Circuits

Authors

• William E. Cobb, Air Force Institute of Technology
• Eric D. Laspe, Air Force Institute of Technology
• Rusty O. Baldwin, Air Force Institute of Technology
• Michael A. Temple, Air Force Institute of Technology
• Yong C. Kim, Air Force Institute of Technology

Document Type

Article

Publication Date

2-2012

Comments

Copyright © 2012, IEEE
The full text of this article is available from IEEE via subscription or purchase, using the DOI link below.

DOI

10.1109/TIFS.2011.2160170

Source Publication

IEEE Transactions on Information Forensics and Security (ISSN 1556-6013)

Recommended Citation

W. E. Cobb, E. D. Laspe, R. O. Baldwin, M. A. Temple and Y. C. Kim, "Intrinsic Physical-Layer Authentication of Integrated Circuits," in IEEE Transactions on Information Forensics and Security, vol. 7, no. 1, pp. 14-24, Feb. 2012, doi: 10.1109/TIFS.2011.2160170.