Matrix determination of hidden object reflectance by indirect photography

Authors

• Simon S. Ferrel, Air Force Institute of Technology
• Michael A. Marciniak, Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

10-15-2012

Comments

Copyright © 2012 Society of Photo-Optical Instrumentation Engineers (SPIE).
The full text of this conference paper is available from SPIE via subscription or purchase, using the DOI link on this page.

Event: SPIE Optical Engineering + Applications, 2012, San Diego

DOI

10.1117/12.929095

Source Publication

Proceedings of SPIE, Volume 8495: Reflection, Scattering, and Diffraction from Surfaces III

Recommended Citation

Simon S. Ferrel, Michael A. Marciniak "Matrix determination of hidden object reflectance by indirect photography", Proc. SPIE 8495, Reflection, Scattering, and Diffraction from Surfaces III, 84950Q (15 Oct 2012); https://doi.org/10.1117/12.929095