Gamma and X-ray sensitivity of Gd₂O₃ heterojunctions

Authors

• Juan A. Colon Santana, University of Nebraska-Lincoln
• Christopher M. Young, Air Force Institute of Technology
• John W. McClory, Air Force Institute of Technology
• X. Wang, University of Wyoming
• P. Liu, University of Wyoming
• Jinke Tang, University of Wyoming
• Volodymyr T. Adamiv, Institute of Physical Optics - Lviv, Ukraine
• Yaroslav V. Burak, Institute of Physical Optics - Lviv, Ukraine
• Keisuke Fukutani, University of Nebraska-Lincoln
• Peter A. Dowben, University of Nebraska-Lincoln

Document Type

Article

Publication Date

4-2013

Comments

Plain-text title form: Gamma and X-ray sensitivity of Gd2O3 heterojunctions

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DOI

10.1016/j.radmeas.2013.02.021

Source Publication

Radiation Measurements (ISSN 1350-4487)

Recommended Citation

Colón Santana, J. A., Young, C. M., McClory, J. W., Petrosky, J. C., Wang, X., Liu, P., Tang, J., Adamiv, V. T., Burak, Ya. V., Fukutani, K., & Dowben, P. A. (2013). Gamma and X-ray sensitivity of Gd2O3 heterojunctions. Radiation Measurements, 51–52, 99–102. https://doi.org/10.1016/j.radmeas.2013.02.021