Electromagnetic Interference (EMI) and Ionizing Radiation Effects on CMOS Devices

Authors

• Nicholas A. Estep, Air Force Institute of Technology
• James C. Petrosky, Air Force Institute of Technology
• John W. McClory, Air Force Institute of Technology
• Y. Kim, Air Force Institute of Technology
• Andrew J. Terzuoli Jr., Air Force Institute of Technology

Document Type

Article

Publication Date

6-2012

Comments

Copyright © 2012, IEEE

The full article is available by subscription or purchase from IEEE, using the DOI link below.

DOI

10.1109/TPS.2012.2193600

Source Publication

IEEE Transactions on Plasma Science

Recommended Citation

N. A. Estep, J. C. Petrosky, J. W. McClory, Y. Kim and A. J. Terzuoli, "Electromagnetic Interference and Ionizing Radiation Effects on CMOS Devices," in IEEE Transactions on Plasma Science, vol. 40, no. 6, pp. 1495-1501, June 2012, doi: 10.1109/TPS.2012.2193600.