Analysis of Transient Electromagnetic Scattering from Overfilled Cavities

Authors

• Aihua W. Wood, Air Force Institute of TechnologyFollow
• Tri Van, Mission Research Corporation

Document Type

Article

Publication Date

2004

Comments

Copyright © 2004 Society for Industrial and Applied Mathematics.

The full article is available by subscription or purchase using the DOI link below.

DOI

10.1137/S0036139902419255

Source Publication

SIAM Journal on Applied Mathematics (ISSN 0036-1399 | eISSN 1095-712X)

Recommended Citation

Wood, A., & Van, T. (2004). Analysis of transient electromagnetic scattering from overfilled cavities. SIAM Journal on Applied Mathematics, 64(2), 688–708. https://doi.org/10.1137/S0036139902419255