10.1109/URSI-EMTS.2010.5637074">
 

Dual-probe lowloss material extraction technique

Document Type

Conference Proceeding

Publication Date

8-16-2010

Abstract

Excerpt: A dual-probe rectangular waveguide material-parameter extraction technique capable of accommodating lowloss samples is presented. The technique's ability to easily measure reflection and transmission (R/T) coefficients necessary for simultaneous extraction of permittivity and permeability over all frequencies is discussed.

Comments

© 2010, IEEE

Co-author M. Hyde was an AFIT PhD candidate at the time of this conference. (AFIT-DEE-ENG-10-12, September 2010)

Source Publication

Symposium Digest - 20th URSI International Symposium on Electromagnetic Theory, EMTS 2010

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