Dual-probe lowloss material extraction technique
Document Type
Conference Proceeding
Publication Date
8-16-2010
Abstract
Excerpt: A dual-probe rectangular waveguide material-parameter extraction technique capable of accommodating lowloss samples is presented. The technique's ability to easily measure reflection and transmission (R/T) coefficients necessary for simultaneous extraction of permittivity and permeability over all frequencies is discussed.
Source Publication
Symposium Digest - 20th URSI International Symposium on Electromagnetic Theory, EMTS 2010
Recommended Citation
M. J. Havrilla and M. W. Hyde, "Dual-probe lowloss material extraction technique," 2010 URSI International Symposium on Electromagnetic Theory, Berlin, Germany, 2010, pp. 239-242, doi: 10.1109/URSI-EMTS.2010.5637074.
Comments
© 2010, IEEE
Co-author M. Hyde was an AFIT PhD candidate at the time of this conference. (AFIT-DEE-ENG-10-12, September 2010)