Reducing the measurement footprint in the characterization of low-loss materials using the flanged-waveguide measurement geometry

Authors

Milo W. Hyde IV, Air Force Institute of Technology
Michael J. Havrilla, Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

9-20-2010

Abstract

Excerpt: The purpose of this paper is to demonstrate how the flanged-waveguide material-characterization technique, originally designed to characterize lossy materials only, can be extended to accurately extract permittivity and permeability of low-loss materials. Provided in this paper is a summary of the flanged-waveguide technique. Abstract © IEEE

Comments

Copyright © 2010, IEEE

Co-author M. Hyde was an AFIT PhD candidate at the time of this conference. (AFIT-DEE-ENG-10-12, September 2010)

DOI

10.1109/ICEAA.2010.5652258

Source Publication

Proceedings - 2010 12th International Conference on Electromagnetics in Advanced Applications, ICEAA'10

Recommended Citation

M. W. Hyde and M. J. Havrilla, "Reducing the measurement footprint in the characterization of low-loss materials using the flanged-waveguide measurement geometry," 2010 International Conference on Electromagnetics in Advanced Applications, Sydney, NSW, Australia, 2010, pp. 43-46, doi: 10.1109/ICEAA.2010.5652258.