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A domain-knowledge-inspired mathematical framework for the description and classification of H&E stained histopathology images

Document Type

Conference Proceeding

Publication Date

9-27-2011

Comments

Copyright © 2011 Society of Photo-Optical Instrumentation Engineers (SPIE).

Co-author M. Massar was enrolled in an AFIT PhD program at the time of this conference. (AFIT-DAM-ENC-12-02, March 2012)

Source Publication

Proceedings of SPIE 8138: Wavelets and Sparsity XIV

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