Reliability testing of AlGaN/GaN HEMTs under multiple stressors

Authors

Bradley D. Christiansen, Air Force Institute of Technology
Ronald A. Coutu Jr., Air Force Institute of Technology
Eric R. Heller, Air Force Research Laboratory
Brian S. Poling, Air Force Research Laboratory
G. David Via, Air Force Research Laboratory
Rama Vetury, Defense and Power, RF Micro Devices, Inc.
Jeffrey B. Shealy, Defense and Power, RF Micro Devices, Inc.

Document Type

Conference Proceeding

Publication Date

4-10-2011

Comments

Copyright © 2011, IEEE

Co-author B. Christiansen was enrolled in an AFIT PhD program at the time of this conference. (AFIT-DEE-ENG-11-04, December 2011)

DOI

10.1109/IRPS.2011.5784556