Examining epsilon near zero structures through effective medium theory and optical thin film analysis
Document Type
Conference Proceeding
Publication Date
6-8-2012
Source Publication
Proceedings of SPIE 8364: Polarization: Measurement, Analysis, and Remote Sensing X
Recommended Citation
Jason C. Vap, Michael A. Marciniak, Mark Moran, and Linda Johnson "Examining epsilon near zero structures through effective medium theory and optical thin film analysis", Proc. SPIE 8364, Polarization: Measurement, Analysis, and Remote Sensing X, 83640Q (8 June 2012); https://doi.org/10.1117/12.919053
COinS
Comments
Copyright © 2012 Society of Photo-Optical Instrumentation Engineers (SPIE).
This SPIE conference paper is accessible by subscription or purchase, using the DOI link below.
Co-author J. Vap was an AFIT PhD candidate at the time of this conference. (AFIT-ENP-DS-12-03, December 2012)