Simple, Broadband Material Characterization Using Dual-Ridged Waveguide to Rectangular Waveguide Transitions

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A simple technique is presented which utilizes dual-ridged waveguide to rectangular waveguide transitions to provide broadband material characterization measurements. Compared to a recently published technique which used dual-ridged waveguides, the proposed method significantly simplifies specimen preparation while maintaining measurement bandwidth. The behavior of the fields in the dual-ridged waveguide to rectangular waveguide transitions is briefly discussed. In addition, a brief discussion on the derivation of the theoretical scattering parameters, required for the extraction of permittivity and permeability of the material under test, is provided. Experimental material characterization results of a magnetic absorbing material are presented and analyzed to validate the proposed technique. Abstract © IEEE.


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IEEE Transactions on Electromagnetic Compatibility