Simple, Broadband Material Characterization Using Dual-Ridged Waveguide to Rectangular Waveguide Transitions
Document Type
Article
Publication Date
2-2014
Abstract
A simple technique is presented which utilizes dual-ridged waveguide to rectangular waveguide transitions to provide broadband material characterization measurements. Compared to a recently published technique which used dual-ridged waveguides, the proposed method significantly simplifies specimen preparation while maintaining measurement bandwidth. The behavior of the fields in the dual-ridged waveguide to rectangular waveguide transitions is briefly discussed. In addition, a brief discussion on the derivation of the theoretical scattering parameters, required for the extraction of permittivity and permeability of the material under test, is provided. Experimental material characterization results of a magnetic absorbing material are presented and analyzed to validate the proposed technique. Abstract © IEEE.
DOI
10.1109/TEMC.2013.2274898
Source Publication
IEEE Transactions on Electromagnetic Compatibility
Recommended Citation
M. W. Hyde and M. J. Havrilla, "Simple, Broadband Material Characterization Using Dual-Ridged Waveguide to Rectangular Waveguide Transitions," in IEEE Transactions on Electromagnetic Compatibility, vol. 56, no. 1, pp. 239-242, Feb. 2014.
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