"Electrical characterization studies of p-type Ge, Ge<sub>1-y</sub> Sn " by Thomas R. Harris, Mee-Yi Ryu et al. 10.1016/j.cap.2013.11.009">
 

Electrical characterization studies of p-type Ge, Ge1-y Sn y, and Si0.09Ge0.882Sn0.028 grown on n-Si substrates

Document Type

Article

Publication Date

3-14-2014

Comments

Plain-text title form: Electrical characterization studies of p-type Ge, Ge1-y Sn y, and Si0.09Ge0.882Sn0.028 grown on n-Si substrates

Source Publication

Current Applied Physics (ISSN 1567-1739)

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