Pixel material classification using polarimetric LiDAR active imaging

Authors

Richard K. Martin, Air Force Institute of Technology
Christian K. Keyser
P. Khanh Ngyuyen
Arielle M. Adams

Document Type

Article

Publication Date

4-8-2025

Comments

Copyright © 2025 Optica Publishing Group. All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.

This article is part of the Applied Optics Institutional Focus Issue of Applied Optics, Air Force Institute of Technology

DOI

10.1364/AO.554768

Source Publication

Applied Optics (ISSN 1559-128X | eISSN 2155-3165)

Recommended Citation

Richard K. Martin, Christian K. Keyser, P. Khanh Nguyen, and Arielle M. Adams, "Pixel material classification using polarimetric LiDAR active imaging," Appl. Opt. 64, E53-E61 (2025)