Experimental measurement and analysis of wavelength-dependent properties of the BRDF
Document Type
Conference Proceeding
Publication Date
9-1-2015
Abstract
The microfacet BRDF model is preferred to describe reflectance in many applications due to its closed-form approximation to the BRDF which is relatively easy to use; however, it almost entirely excludes wavelength-dependent scaling of the reflectance distribution. To rectify this, the BRDF was measured at multiple incident angles and for multiple materials at several wavelengths between 3.39 μm and 10.6 μm. Results quantify the dramatic change in the specular BRDF of a variety of materials even after accounting for overall reflectance, and suggests it is necessary to modify the wavelength dependence in the microfacet model.
Source Publication
Proceedings of SPIE Volume 9611, Imaging Spectrometry XX
Recommended Citation
Samuel D. Butler, Stephen E. Nauyoks, and Michael A. Marciniak "Experimental measurement and analysis of wavelength-dependent properties of the BRDF", Proc. SPIE 9611, Imaging Spectrometry XX, 96110G (1 September 2015); https://doi.org/10.1117/12.2188093
Comments
Copyright © 2015 Society of Photo-Optical Instrumentation Engineers (SPIE).
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Author Note: Samuel Butler was an AFIT PhD student at the time of this conference.