Multi-mode analysis of dual ridged waveguide systems for material characterization

Authors

Jason G. Crosby, Air Force Institute of Technology
Milo W. Hyde IV, Air Force Institute of Technology
Michael J. Havrilla, Air Force Institute of TechnologyFollow

Document Type

Conference Proceeding

Publication Date

7-2015

Comments

Copyright © 2015, IEEE.

This conference paper is available through subscription or purchase from the publisher, IEEE, using the DOI link below.

Author note: Jason Crosby was an AFIT PhD candidate at the time of this conference. (AFIT-ENG-DS-15-S-011, September 2015)

DOI

10.1109/USNC-URSI.2015.7303317

Source Publication

2015 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium)

Recommended Citation

. G. Crosby, M. W. Hyde and M. J. Havrilla, "Multi-mode analysis of dual ridged waveguide systems for material characterization," 2015 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium), Vancouver, BC, Canada, 2015, pp. 33-33, doi: 10.1109/USNC-URSI.2015.7303317.