Dimensional reduction analysis for Physical Layer device fingerprints with application to ZigBee and Z-Wave devices

Authors

Trevor J. Bihl, Air Force Research LaboratoryFollow
Kenneth W. Bauer Jr., Air Force Institute of TechnologyFollow
Michael A. Temple, Air Force Institute of TechnologyFollow
Benjamin W. Ramsey, Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

10-26-2015

Comments

Copyright © 2015, IEEE.

This conference paper is available through subscription or purchase from the publisher, IEEE, using the DOI link below.

DOI

10.1109/MILCOM.2015.7357469

Source Publication

Military Communications Conference, MILCOM 2015 - 2015 IEEE

Recommended Citation

T. J. Bihl, K. W. Bauer, M. A. Temple and B. Ramsey, "Dimensional reduction analysis for Physical Layer device fingerprints with application to ZigBee and Z-Wave devices," MILCOM 2015 - 2015 IEEE Military Communications Conference, Tampa, FL, USA, 2015, pp. 360-365, doi: 10.1109/MILCOM.2015.7357469.