Parameter Extraction Algorithm for Conductor Backed, Bi-Layered Uniaxial Materials

Authors

Adam L. Brooks
Michael J. Havrilla, Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

11-1-2018

Abstract

An algorithm is developed for the extraction of constitutive parameters from bi-layered uniaxial anisotropic materials backed by a conductive layer. A method of moments-based approach is used in conjunction with a previously-determined Green function. Possible challenges related to measurement diversity are highlighted and a possible mitigation path is proposed. Abstract © AMTA.

Comments

This conference paper is published by IEEE as cited, and is available by purchase or subscription through the link in the citation.

Source Publication

Annual Symposium of the Antenna Measurement Techniques Association 2018, AMTA 2018

Recommended Citation

A. L. Brooks and M. J. Havrilla, "Parameter Extraction Algorithm for Conductor Backed, Bi-Layered Uniaxial Materials," 2018 AMTA Proceedings, Williamsburg, VA, USA, 2018, pp. 1-6. https://ieeexplore.ieee.org/document/8604159