Augmenting CASI® BRDF measurement device to measure out-of-plane scatter with CCD pixel array

Authors

Todd V. Small, Air Force Institute of Technology
Samuel D. Butler, Air Force Institute of Technology
Michael A. Marciniak, Air Force Institute of Technology

Document Type

Conference Proceeding

Publication Date

8-31-2020

Comments

© 2020 Society of Photo-Optical Instrumentation Engineers (SPIE). The full text of this conference paper is available via subscription or purchase through the DOI link on this page.

Co-author Todd Small was an AFIT PhD student at the time of this conference. (AFIT-ENP-DS-21-S-035, September 2021.)

DOI

10.1117/12.2568050

Source Publication

Proceedings of SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII

Recommended Citation

Todd V. Small, Samuel D. Butler, and Michael A. Marciniak "Augmenting CASI® BRDF measurement device to measure out-of-plane scatter with CCD pixel array", Proc. SPIE 11485, Reflection, Scattering, and Diffraction from Surfaces VII, 114850B (31 August 2020); https://doi.org/10.1117/12.2568050