Gated Reflect Line Self-Calibration Technique for Accurate Material Parameter Extraction with Focus Beam Systems
Document Type
Article
Publication Date
9-2024
Abstract
This paper introduces a self-calibration Gated Reflect Line technique of free-space focus beam systems with experimental results for validation. The procedure assumes same surface of the Reflect standard is used to measure the back scattered channels of each network analyzer port. Equivalent cascaded scattering parameter blocks are then formulated to identify the reflection coefficient of the Reflect metrology standard. The calibration scheme is subsequently updated to include the actual reflection coefficient rather than use the ideal metal plate assumption. Finally, measured results with a 2–18 GHz focus beam system and plexiglass sample are included to compare the self-calibration to conventional technique with a Monte Carlo error analysis. This self-calibration procedure accounts for imperfections in the Reflect standard where any deviations from an ideal perfect electrical conductor result in residual errors. The introduced technique enhances the measurement accuracy and enables loss tangent extraction of low-loss materials.
Source Publication
2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI)
Recommended Citation
J. P. Massman and M. J. Havrilla, "Gated Reflect Line Self-Calibration Technique for Accurate Material Parameter Extraction with Focus Beam Systems," 2024 IEEE International Symposium on Antennas and Propagation and INC/USNC‐URSI Radio Science Meeting (AP-S/INC-USNC-URSI), Firenze, Italy, 2024, pp. 909-910, doi: 10.1109/AP-S/INC-USNC-URSI52054.2024.10686798.
Comments
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