Document Type
Conference Proceeding
Publication Date
4-2007
Source Publication
Visual Information Processing XVI, Proceedings of SPIE 6575
Recommended Citation
Benjamin M. Rodriguez, Gilbert L. Peterson, and Sos S. Agaian "Steganalysis feature improvement using expectation maximization", Proc. SPIE 6575, Visual Information Processing XVI, 657506 (30 April 2007); https://doi.org/10.1117/12.720794
Comments
Copyright © 2007 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited.
AFIT Scholar, the repository of AFIT, furnishes the draft of this conference paper. The version of record published in Proceedings of SPIE is fully cited below, and available through the DOI link on this page.
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