Document Type

Article

Publication Date

6-10-2014

Abstract

A new probe which utilises a dual-ridged waveguide to provide broadband, non-destructive (ND) material characterisation measurements of a perfect electric conductor (PEC)-backed material is introduced. The new probe possesses a bandwidth similar to existing coaxial probes and is structurally robust like rectangular waveguide probes. The combinations of these two qualities make it especially attractive for ND inspection/evaluation applications in the field. The theoretical development of the dual-ridged-waveguide probe is discussed. A magnetic field integral equation is derived by applying Love’s equivalence theorem and enforcing the continuity of transverse fields at the dual-ridged-waveguide aperture. The magnetic field integral equation is then solved for the theoretical reflection coefficient using the method of moments. The permittivity and permeability of the material under test are found by minimising the root-mean-square difference between the theoretical and measured reflection coefficients using non-linear least squares. To validate the new probe, experimental results are presented of a magnetic absorbing material comparing results obtained using the new probe with those obtained using a traditional, destructive technique. The probe’s sensitivity to sample thickness, flange-plate thickness, cutoff wavenumber and measured S-parameter uncertainties is also investigated.

Comments

Version of record at IET Digital Library: https://digital-library.theiet.org/content/journals/10.1049/iet-smt.2013.0128

Found as: Hyde IV, M. W., & Havrilla, M. J. (2015). Broadband, non-destructive characterisation of PEC-backed materials using a dual-ridged-waveguide probe. IET Science, Measurement & Technology, 9(1), 56–62. https://doi.org/10.1049/iet-smt.2013.0128

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"Creative Commons licences: For articles published under a Creative Commons licence all versions (including the final published version) may be deposited. The published source must be acknowledged, the DOI cited and a link given to the version on the IET Digital Library."

This is an open access article published by the IET under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/3.0/) CC BY 3.0

DOI

10.1049/iet-smt.2013.0128

Source Publication

IET Science, Measurement and Technology

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