Signal Quality Monitoring through Analysis of Chip Shape Deformation for GNSS Signals

Authors

Nicholas C. Echeverry, Air Force Institute of Technology
J. Addison Betances, Air Force Institute of TechnologyFollow
Sanjeev Gunawardena, Air Force Institute of TechnologyFollow
Michael Temple, Air Force Institute of TechnologyFollow

Document Type

Conference Proceeding

Publication Date

10-2020

Comments

Copyright statement: © 2020 ION 2020 International Technical Meeting Proceedings.

The full text of the conference paper is hosted at the ION website for ION members. It is also accessible at cost to non-members. A DOI link is provided on this page for the reader to investigate access options at ION.

DOI

10.33012/2020.17694

Source Publication

Proceedings of the 33rd International Technical Meeting of the Satellite Division of the Institute of Navigation, ION GNSS+ 2020

Recommended Citation

Echeverry, Nicholas C., Betances, J. Addison, Gunawardena, Sanjeev, Temple, Michael A., "Signal Quality Monitoring through Analysis of Chip Shape Deformation for GNSS Signals," Proceedings of the 33rd International Technical Meeting of the Satellite Division of The Institute of Navigation (ION GNSS+ 2020), September 2020, pp. 1454-1461. https://doi.org/10.33012/2020.17694