We develop a series of analytical approximations allowing for rapid extraction of the nonlinear parameters from beam deflection measurements. We then apply these approximations to the analysis of cadmium silicon phosphide and compare the results against previously published parameter extraction methods and find good agreement for typical experimental conditions.
Optical Materials Express
Manuel R. Ferdinandus, Jennifer M. Reed, Kent L. Averett, F. Kenneth Hopkins, and Augustine Urbas, "Analysis of beam deflection measurements in the presence of linear absorption," Opt. Mater. Express 7, 1598-1605 (2017). https://doi.org/10.1364/OME.7.001598