The Impact of Cathode Geometry on Electron Hot Spot Formation and Ion Beam Properties in Pinched-Beam Diodes
Document Type
Conference Proceeding
Publication Date
9-2024
Abstract
Electron and ion dynamics in a cylindrical pinched-beam diode with 1.6 MV, 800 kA, and 50 ns parameters were studied using particle-in-cell simulations to improve ion beam uniformity. In particular, this work explored how annular cathode tip thickness affected electron hot spot formation and the resulting ion beam. Simulations showed reduced electron hot spots and a more uniform ion beam for a 0.5-mm-thick cathode tip compared to a 3-mm-thick cathode tip.
Source Publication
2024 10th Euro-Asian Pulsed Power Conference, 25th International Conference on High-Power Particle Beams and 20th International Symposium on Electromagnetic Launch Technology (EAPPC/BEAMS/EML)
Recommended Citation
A. K. Tichy, J. C. Foster, S. B. Swanekamp and P. F. Ottinger, "The Impact of Cathode Geometry on Electron Hot Spot Formation and Ion Beam Properties in Pinched-Beam Diodes," 2024 10th Euro-Asian Pulsed Power Conference, 25th International Conference on High-Power Particle Beams and 20th International Symposium on Electromagnetic Launch Technology (EAPPC/BEAMS/EML), Amsterdam, Netherlands, 2024, pp. 1-2. https://ieeexplore.ieee.org/document/10748135
Comments
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