The Impact of Cathode Geometry on Electron Hot Spot Formation and Ion Beam Properties in Pinched-Beam Diodes

Document Type

Conference Proceeding

Publication Date

9-2024

Abstract

Electron and ion dynamics in a cylindrical pinched-beam diode with 1.6 MV, 800 kA, and 50 ns parameters were studied using particle-in-cell simulations to improve ion beam uniformity. In particular, this work explored how annular cathode tip thickness affected electron hot spot formation and the resulting ion beam. Simulations showed reduced electron hot spots and a more uniform ion beam for a 0.5-mm-thick cathode tip compared to a 3-mm-thick cathode tip.

Comments

This conference paper is accessible by subscription through the link in the full citation below.

Source Publication

2024 10th Euro-Asian Pulsed Power Conference, 25th International Conference on High-Power Particle Beams and 20th International Symposium on Electromagnetic Launch Technology (EAPPC/BEAMS/EML)

This document is currently not available here.

Share

COinS