Document Type
Article
Publication Date
7-22-2017
Abstract
Results of a method of estimating index of refraction from passive, polarimetric hyperspectral imaging radiance measurements are presented. As off-nadir viewing hyperspectral imaging platforms gain prominence, estimating index of refraction, which is invariant to viewing angle, may prove advantageous to estimating the emissivity, which is not. Results show that index of refraction can be retrieved to within 8% rms error for fused silica and sapphire glass targets, while simultaneously estimating object temperature. The accuracy and self-consistency of this technique for estimating index of refraction are shown to compare favorably to the maximum smoothness temperature–emissivity separation algorithm. Additionally, the results show that atmospheric downwelling radiance can also be accurately estimated, to within the noise of the instrument, concurrently with index of refraction.
DOI
10.1117/1.OE.56.8.081812
Source Publication
Optical Engineering
Recommended Citation
J. A. Martin and K. C. Gross, “Estimating index of refraction for specular reflectors using passive polarimetric hyperspectral radiance measurements,” Opt. Eng. 56(8) (2017) [doi:10.1117/1.OE.56.8.081812]. https://doi.org/10.1117/1.OE.56.8.081812
Comments
This is an open access article published by SPIE and distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. CC BY 3.0
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