Mark L. Sward

Date of Award

12-1990

Document Type

Thesis

Degree Name

Master of Science

Department

Department of Engineering Physics

First Advisor

James D. Targove, Captain, USAF

Abstract

This thesis demonstrated the feasibility of determining the optical properties of organic and polymer thin films through the use of Spectroscopic Ellipsometry (SE). Tan Psi and cos Delta data from 300-800 nanometers (NM) were taken with a Rudolph Research s2000 spectroscopic ellipsometer four samples: indium tin oxide (ITO) coated glass; five layer poly-benzyl-L glutamate (PBLG) organic film on ITO coated glass; eight layer PBLG film on ITO coated glass; and a thiophene polymer film on a microscope slide. The data sets were fit to a choice of four computer models based on a paper written by Dwight Berreman in 1972. The four were written in MATLAB to take advantage of its matrix manipulative capabilities. The models were: a single layer isotropic film on an isotropic substrate; a single layer anisotropic film on an isotropic substrate; two isotropic films on an isotropic substrate; and two anisotropic films on an isotropic substrate. Using only tan Psi data over a restricted wavelength region, all four data sets were fit to variances of 0.01 or less.

AFIT Designator

AFIT-GEP-ENP-90D-8

DTIC Accession Number

ADA230427

Comments

The author's Vita page is omitted

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