Date of Award

12-1991

Document Type

Thesis

Degree Name

Master of Science

Department

Department of Electrical and Computer Engineering

First Advisor

Philip J. Joseph, PhD

Abstract

This thesis investigated the electromagnetic scattering from conducting, lossless dielectric, and lossy dielectric (absorber) pyramids. The backscatter from pyramids was measured and a time gate was applied to isolate the scattering from the tips. The measured results were compared to predictions from an approximate Uniform Theory of Diffraction (UTD) solution for scattering by a dielectric corner. The accuracy of the corner diffraction solution was found to be dependent on the polarization of the incident electric field. The accuracy of the UTD solution was also dependent on the aspect angle to the pyramid: the UTD solution gave a nominally correct answer within 25 degrees of nose-on incidence; at other angles the accuracy was better or worse depending on field polarization. The accuracy of the corner diffraction solution when applied to a dielectric was primarily dependent on the tip angle of the pyramid, with more acute angles giving the least accurate results. At incidence angles near nose-on to absorber pyramids, scattering from internal inhomogeneities was the dominant scattering mechanism. At incidence angles away from nose-on, the UTD solution provided reasonably accurate results. The approximate UTD dielectric corner solution was found to be accurate for many engineering applications. (Author)

AFIT Designator

AFIT-GE-ENG-91D-56

DTIC Accession Number

ADA243877

Comments

The author's Vita page is omitted.

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