Date of Award
12-1991
Document Type
Thesis
Degree Name
Master of Science
Department
Department of Electrical and Computer Engineering
First Advisor
Philip J. Joseph, PhD
Abstract
This paper investigates the scattering from impedance strips and impedance-loaded conducting strips. The impedance strips are analyzed using Senior's impedance half plane formulation. Once the primary diffraction from the impedance half plane is presented, it is used to develop multiple diffraction mechanisms on an impedance strip. The scattering from impedance-loaded strips are analyzed using Maliuzhinets' impedance wedge formulation. The primary diffraction mechanism from an impedance wedge is used to develop the multiple diffractions on an impedance double wedge. The multiple diffractions on both types of strips are developed using the Extended Spectral Ray Method. Sample calculations are made for impedance strips and impedance-loaded strips for a large purely capacitive impedance, a large purely inductive impedance, a large real impedance, and a small real impedance. Measurements are made for impedance strips and impedance loaded strips and are used to compare against predictions. The impedance materials used are two magnetic radar absorbing materials and two resistive materials. (Author)
AFIT Designator
AFIT-GE-ENG-91D-18
DTIC Accession Number
ADA243649
Recommended Citation
Fortney, Joseph C., "A Rigorous Uniform Diffraction Analysis of the Electromagnetic Scattering from Impedance Edges and Junctions" (1991). Theses and Dissertations. 7552.
https://scholar.afit.edu/etd/7552
Comments
The author's Vita page is omitted.