Date of Award
3-2023
Document Type
Thesis
Degree Name
Master of Science
Department
Department of Engineering Physics
First Advisor
Christina L. Dugan, PhD
Abstract
Germanium tin (GeSn) alloys are being studied as potential transition metal (Group IV) photoelectric semiconductors or optical detectors. GeSn alloys could be employed as an optically active material within a computer. Compared to current technologies, a direct band gap GeSn alloy can be engineered to operate with higher thermal stability and efficiency. The GeSn alloy studied was composed of Ge and Si substrates with various Sn percentages grown using remote plasma-enhanced chemical vapor deposition (RPECVD). Photoluminescence spectroscopy (PL) techniques were initially used to determine the GeSn properties, including the band gap. The Ge91.2Sn8.8 PL spectra suggested the band gap energies were below the detection threshold. In addition, samples containing lower Sn concentrations appeared to be non-radiative. Additional investigations using the Scanning Electron Microscope (SEM) provided indications of surface roughness and Sn surface migration within the GeSn samples. Using Electron Dispersive Spectroscopy (EDS) at multiple probing energy potentials confirmed variations in Sn concentrations throughout the sample.
AFIT Designator
AFIT-ENP-MS-23-M-107
Recommended Citation
Sutphin, Christopher M., "Characterizing GeSn Alloys by SEM/EDS and Photoluminescence Spectroscopy" (2023). Theses and Dissertations. 7354.
https://scholar.afit.edu/etd/7354
Included in
Atomic, Molecular and Optical Physics Commons, Semiconductor and Optical Materials Commons
Comments
A 12-month embargo was observed.
Cleared for public release. PA case number on file.